Modern semiconductor manufacturing demands unprecedented precision. Today's advanced chips feature more transistors than people on Earth, with structures 10x smaller than a virus and control requirements at the atomic scale. These devices power everything from smartphones to AI, 5G to autonomous vehicles - yet scaling these processes requires sub-nanometer measurement of increasingly complex 3D structures that traditional metrology cannot reliably deliver.
Infinitesima solves this fundamental challenge through revolutionary atomic precision 3D metrology technology. Spun out of the University of Bristol in 2001 by CTO Professor Andrew Humphris, Infinitesima developed the Rapid Probe Microscope (RPM) - a fundamentally different approach combining atomic force microscopy with high-speed laser activation and interferometric accuracy. The RPM delivers picometer precision at speeds 100x faster than conventional probe techniques, enabling cost-effective in-line 3D process control essential for continued semiconductor advancement. With flagship products like Metron3D and RPM Scanner, Infinitesima's technology has been qualified by leading semiconductor companies worldwide, backed by investors including Applied Ventures, and deployed to enable the next generation of powerful semiconductor devices.